Wednesday, September 15, 2010

Radiation testing of ICs with Ion-photon-emission microscopy

A news item at SPIE regarding a new instrument at Sandia National Labs: "Radiation testing and imaging of micro-electronics"
[...] as technology advances, features in satellites and spacecraft are getting smaller and, therefore, more susceptible to radiation damage. IPEM, once fully developed and validated as a means of testing the radiation hardness of micro-electronics, will contribute to the development of new and emerging radiation-tolerant IC technologies far into the future.

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