Thursday, January 21, 2010

IEEEXplore watch: Measurement of High Sensitivity and Low Crosstalk of Zero-Space Microlens for 2.8- microns-Pitch Active Pixel Sensor

From the February 2010 IEEE Transactions on Electron Devices: "Measurement of High Sensitivity and Low Crosstalk of Zero-Space Microlens for 2.8-um-Pitch Active Pixel Sensor"
This paper presents the sensitivity analysis of both normal microlenses and zero-space microlenses based on the wafer test data from the Teradyne IP750, which is a special wafer test platform for CMOS sensors. The results of the statistical data of the wafer test show that the sensitivity of the zero-space microlenses has been improved by about 73.6% on the red pixel (69.6% on the green pixel and 76.3% on the blue pixel) compared with that of the normal microlenses.

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