Wednesday, December 2, 2009

Transistor noise model

More info on the new transistor noise model for low-frequency noise (1/f and RTS) from SEMATECH: "New transistor noise model helps ID defects in gate stacks".
According to Michael Shur, professor at Rensselaer Polytechnic Institute, "The SEMATECH work explains several orders of magnitude difference between older, so-called, tunneling models and the noise measured in advanced CMOS with ultrathin oxide layers."

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