Wednesday, December 2, 2009

Transistor noise model

More info on the new transistor noise model for low-frequency noise (1/f and RTS) from SEMATECH: "New transistor noise model helps ID defects in gate stacks".
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According to Michael Shur, professor at Rensselaer Polytechnic Institute, "The SEMATECH work explains several orders of magnitude difference between older, so-called, tunneling models and the noise measured in advanced CMOS with ultrathin oxide layers."

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